Comparison of Genetic and Random Techniques for Test Pattern Generation
نویسندگان
چکیده
* This work has been supported by the Estonian Science Foundation grant G-1850 ABSTRACT: Current paper presents a test pattern generation approach based on genetic algorithms. The algorithm is designed so that it allows direct comparison with random methods. Experimental results on ISCAS'85 benchmarks [6] show that the proposed algorithm performs significantly better than similar approach published in [1]. In addition, the test sets generated by the algorithm are more compact.
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